Effects of different needles and substrates on CuInS2 deposited by electrostatic spray deposition
Identifieur interne : 003092 ( Main/Repository ); précédent : 003091; suivant : 003093Effects of different needles and substrates on CuInS2 deposited by electrostatic spray deposition
Auteurs : RBID : Pascal:11-0200978Descripteurs français
- Pascal (Inist)
- Cellule solaire, Dépôt électrolytique, Indium, Couche mince, Aérosol, Composition phase, Composition surface, Morphologie surface, Addition fluor, Addition étain, Oxydation, Verre, Diffraction RX, Microscopie électronique balayage, Sulfure de cuivre, Sulfure d'indium, Cuivre, Oxyde d'étain, Acier inoxydable, Spectrométrie SIMS, Revêtement, CuInS2, In, Substrat aluminium, SnO2, Substrat verre, 8460J, 8115P, 6855N, 6855J.
- Wicri :
English descriptors
- KwdEn :
- Aerosols, Coatings, Copper, Copper sulfide, Electrodeposition, Fluorine addition, Glass, Indium, Indium sulfide, Oxidation, Phase composition, Scanning electron microscopy, Secondary ion mass spectrometry, Solar cell, Stainless steel, Surface composition, Surface morphology, Thin film, Tin addition, Tin oxide, X ray diffraction.
Abstract
Copper indium disulphide (CuInS2) thin films were deposited using the electrostatic spray deposition method. The effects of applied voltage and solution flow rate on the aerosol cone shape, film composition, surface morphology and current conversion were investigated. The effect of aluminium substrates and transparent fluorine doped tin oxide (SnO2:F) coated glass substrates on the properties of as-deposited CuInS2 films were analysed. An oxidation process occurs during the deposition onto the metallic substrates which forms an insulating layer between the photoactive film and substrate. The effects of two different spray needles on the properties of the as-deposited films were also studied. The results reveal that the use of a stainless steel needle results in contamination of the film due to the transfer of metal impurities through the spray whilst this is not seen for the glass needle. The films were characterised using a number of different analytical techniques such as X-ray diffraction, scanning electron microscopy, Rutherford back-scattering and secondary ion mass spectroscopy and opto-electronic measurements.
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<record><TEI><teiHeader><fileDesc><titleStmt><title xml:lang="en" level="a">Effects of different needles and substrates on CuInS<sub>2</sub> deposited by electrostatic spray deposition</title><author><name sortKey="Roncallo, S" uniqKey="Roncallo S">S. Roncallo</name><affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Centre for Materials Science and Engineering, Cranfield University</s1><s2>Shrivenham, Swindon, SN6 8LA</s2><s3>GBR</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ></inist:fA14><country>Royaume-Uni</country><wicri:noRegion>Shrivenham, Swindon, SN6 8LA</wicri:noRegion></affiliation></author><author><name sortKey="Painter, J D" uniqKey="Painter J">J. D. Painter</name><affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Centre for Materials Science and Engineering, Cranfield University</s1><s2>Shrivenham, Swindon, SN6 8LA</s2><s3>GBR</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ></inist:fA14><country>Royaume-Uni</country><wicri:noRegion>Shrivenham, Swindon, SN6 8LA</wicri:noRegion></affiliation></author><author><name sortKey="Healy, M J F" uniqKey="Healy M">M. J. F. Healy</name><affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Centre for Materials Science and Engineering, Cranfield University</s1><s2>Shrivenham, Swindon, SN6 8LA</s2><s3>GBR</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ></inist:fA14><country>Royaume-Uni</country><wicri:noRegion>Shrivenham, Swindon, SN6 8LA</wicri:noRegion></affiliation></author><author><name sortKey="Ritchie, S A" uniqKey="Ritchie S">S. A. Ritchie</name><affiliation wicri:level="1"><inist:fA14 i1="02"><s1>Department of Engineering Systems and Management, Cranfield University</s1><s2>Shrivenham, Swindon SN6 8LA</s2><s3>GBR</s3><sZ>4 aut.</sZ><sZ>5 aut.</sZ></inist:fA14><country>Royaume-Uni</country><wicri:noRegion>Shrivenham, Swindon SN6 8LA</wicri:noRegion></affiliation></author><author><name sortKey="Finnis, M V" uniqKey="Finnis M">M. V. Finnis</name><affiliation wicri:level="1"><inist:fA14 i1="02"><s1>Department of Engineering Systems and Management, Cranfield University</s1><s2>Shrivenham, Swindon SN6 8LA</s2><s3>GBR</s3><sZ>4 aut.</sZ><sZ>5 aut.</sZ></inist:fA14><country>Royaume-Uni</country><wicri:noRegion>Shrivenham, Swindon SN6 8LA</wicri:noRegion></affiliation></author><author><name sortKey="Rogers, K D" uniqKey="Rogers K">K. D. Rogers</name><affiliation wicri:level="1"><inist:fA14 i1="03"><s1>Cranfield Health, Cranfield University</s1><s2>Cranfield, Bedfordshire, MK43 0AL</s2><s3>GBR</s3><sZ>6 aut.</sZ></inist:fA14><country>Royaume-Uni</country><wicri:noRegion>Cranfield, Bedfordshire, MK43 0AL</wicri:noRegion></affiliation></author><author><name sortKey="Scragg, J J" uniqKey="Scragg J">J. J. Scragg</name><affiliation wicri:level="1"><inist:fA14 i1="04"><s1>University of Bath, Claverton Down</s1><s2>Bath, BA2 7AY</s2><s3>GBR</s3><sZ>7 aut.</sZ></inist:fA14><country>Royaume-Uni</country><wicri:noRegion>Bath, BA2 7AY</wicri:noRegion></affiliation></author><author><name sortKey="Dale, P J" uniqKey="Dale P">P. J. Dale</name><affiliation wicri:level="1"><inist:fA14 i1="05"><s1>Laboratoire Photovoltaique, University of Luxembourg, 41 Rue du Brill</s1><s2>4422, Belvaux</s2><s3>LUX</s3><sZ>8 aut.</sZ></inist:fA14><country>Luxembourg (pays)</country><wicri:noRegion>4422, Belvaux</wicri:noRegion></affiliation></author><author><name sortKey="Zoppi, G" uniqKey="Zoppi G">G. Zoppi</name><affiliation wicri:level="1"><inist:fA14 i1="06"><s1>Northumbria Photovoltaics Applications Centre, Northumbria, University</s1><s2>Newcastle upon Tyne NE1 8ST</s2><s3>GBR</s3><sZ>9 aut.</sZ></inist:fA14><country>Royaume-Uni</country><wicri:noRegion>Newcastle upon Tyne NE1 8ST</wicri:noRegion></affiliation></author></titleStmt><publicationStmt><idno type="inist">11-0200978</idno><date when="2011">2011</date><idno type="stanalyst">PASCAL 11-0200978 INIST</idno><idno type="RBID">Pascal:11-0200978</idno><idno type="wicri:Area/Main/Corpus">003278</idno><idno type="wicri:Area/Main/Repository">003092</idno></publicationStmt><seriesStmt><idno type="ISSN">0040-6090</idno><title level="j" type="abbreviated">Thin solid films</title><title level="j" type="main">Thin solid films</title></seriesStmt></fileDesc><profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Aerosols</term><term>Coatings</term><term>Copper</term><term>Copper sulfide</term><term>Electrodeposition</term><term>Fluorine addition</term><term>Glass</term><term>Indium</term><term>Indium sulfide</term><term>Oxidation</term><term>Phase composition</term><term>Scanning electron microscopy</term><term>Secondary ion mass spectrometry</term><term>Solar cell</term><term>Stainless steel</term><term>Surface composition</term><term>Surface morphology</term><term>Thin film</term><term>Tin addition</term><term>Tin oxide</term><term>X ray diffraction</term></keywords><keywords scheme="Pascal" xml:lang="fr"><term>Cellule solaire</term><term>Dépôt électrolytique</term><term>Indium</term><term>Couche mince</term><term>Aérosol</term><term>Composition phase</term><term>Composition surface</term><term>Morphologie surface</term><term>Addition fluor</term><term>Addition étain</term><term>Oxydation</term><term>Verre</term><term>Diffraction RX</term><term>Microscopie électronique balayage</term><term>Sulfure de cuivre</term><term>Sulfure d'indium</term><term>Cuivre</term><term>Oxyde d'étain</term><term>Acier inoxydable</term><term>Spectrométrie SIMS</term><term>Revêtement</term><term>CuInS2</term><term>In</term><term>Substrat aluminium</term><term>SnO2</term><term>Substrat verre</term><term>8460J</term><term>8115P</term><term>6855N</term><term>6855J</term></keywords><keywords scheme="Wicri" type="concept" xml:lang="fr"><term>Aérosol</term><term>Verre</term><term>Cuivre</term></keywords></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">Copper indium disulphide (CuInS<sub>2</sub>) thin films were deposited using the electrostatic spray deposition method. The effects of applied voltage and solution flow rate on the aerosol cone shape, film composition, surface morphology and current conversion were investigated. The effect of aluminium substrates and transparent fluorine doped tin oxide (SnO<sub>2</sub>:F) coated glass substrates on the properties of as-deposited CuInS<sub>2</sub> films were analysed. An oxidation process occurs during the deposition onto the metallic substrates which forms an insulating layer between the photoactive film and substrate. The effects of two different spray needles on the properties of the as-deposited films were also studied. The results reveal that the use of a stainless steel needle results in contamination of the film due to the transfer of metal impurities through the spray whilst this is not seen for the glass needle. The films were characterised using a number of different analytical techniques such as X-ray diffraction, scanning electron microscopy, Rutherford back-scattering and secondary ion mass spectroscopy and opto-electronic measurements.</div></front></TEI><inist><standard h6="B"><pA><fA01 i1="01" i2="1"><s0>0040-6090</s0></fA01><fA02 i1="01"><s0>THSFAP</s0></fA02><fA03 i2="1"><s0>Thin solid films</s0></fA03><fA05><s2>519</s2></fA05><fA06><s2>11</s2></fA06><fA08 i1="01" i2="1" l="ENG"><s1>Effects of different needles and substrates on CuInS<sub>2</sub> deposited by electrostatic spray deposition</s1></fA08><fA11 i1="01" i2="1"><s1>RONCALLO (S.)</s1></fA11><fA11 i1="02" i2="1"><s1>PAINTER (J. D.)</s1></fA11><fA11 i1="03" i2="1"><s1>HEALY (M. J. F.)</s1></fA11><fA11 i1="04" i2="1"><s1>RITCHIE (S. A.)</s1></fA11><fA11 i1="05" i2="1"><s1>FINNIS (M. V.)</s1></fA11><fA11 i1="06" i2="1"><s1>ROGERS (K. D.)</s1></fA11><fA11 i1="07" i2="1"><s1>SCRAGG (J. J.)</s1></fA11><fA11 i1="08" i2="1"><s1>DALE (P. J.)</s1></fA11><fA11 i1="09" i2="1"><s1>ZOPPI (G.)</s1></fA11><fA14 i1="01"><s1>Centre for Materials Science and Engineering, Cranfield University</s1><s2>Shrivenham, Swindon, SN6 8LA</s2><s3>GBR</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ></fA14><fA14 i1="02"><s1>Department of Engineering Systems and Management, Cranfield University</s1><s2>Shrivenham, Swindon SN6 8LA</s2><s3>GBR</s3><sZ>4 aut.</sZ><sZ>5 aut.</sZ></fA14><fA14 i1="03"><s1>Cranfield Health, Cranfield University</s1><s2>Cranfield, Bedfordshire, MK43 0AL</s2><s3>GBR</s3><sZ>6 aut.</sZ></fA14><fA14 i1="04"><s1>University of Bath, Claverton Down</s1><s2>Bath, BA2 7AY</s2><s3>GBR</s3><sZ>7 aut.</sZ></fA14><fA14 i1="05"><s1>Laboratoire Photovoltaique, University of Luxembourg, 41 Rue du Brill</s1><s2>4422, Belvaux</s2><s3>LUX</s3><sZ>8 aut.</sZ></fA14><fA14 i1="06"><s1>Northumbria Photovoltaics Applications Centre, Northumbria, University</s1><s2>Newcastle upon Tyne NE1 8ST</s2><s3>GBR</s3><sZ>9 aut.</sZ></fA14><fA20><s1>3544-3551</s1></fA20><fA21><s1>2011</s1></fA21><fA23 i1="01"><s0>ENG</s0></fA23><fA43 i1="01"><s1>INIST</s1><s2>13597</s2><s5>354000192872270170</s5></fA43><fA44><s0>0000</s0><s1>© 2011 INIST-CNRS. All rights reserved.</s1></fA44><fA45><s0>25 ref.</s0></fA45><fA47 i1="01" i2="1"><s0>11-0200978</s0></fA47><fA60><s1>P</s1></fA60><fA61><s0>A</s0></fA61><fA64 i1="01" i2="1"><s0>Thin solid films</s0></fA64><fA66 i1="01"><s0>NLD</s0></fA66><fC01 i1="01" l="ENG"><s0>Copper indium disulphide (CuInS<sub>2</sub>) thin films were deposited using the electrostatic spray deposition method. The effects of applied voltage and solution flow rate on the aerosol cone shape, film composition, surface morphology and current conversion were investigated. The effect of aluminium substrates and transparent fluorine doped tin oxide (SnO<sub>2</sub>:F) coated glass substrates on the properties of as-deposited CuInS<sub>2</sub> films were analysed. An oxidation process occurs during the deposition onto the metallic substrates which forms an insulating layer between the photoactive film and substrate. The effects of two different spray needles on the properties of the as-deposited films were also studied. The results reveal that the use of a stainless steel needle results in contamination of the film due to the transfer of metal impurities through the spray whilst this is not seen for the glass needle. The films were characterised using a number of different analytical techniques such as X-ray diffraction, scanning electron microscopy, Rutherford back-scattering and secondary ion mass spectroscopy and opto-electronic measurements.</s0></fC01><fC02 i1="01" i2="X"><s0>001D06C02D1</s0></fC02><fC02 i1="02" i2="3"><s0>001B80A15P</s0></fC02><fC02 i1="03" i2="3"><s0>001B60H55N</s0></fC02><fC02 i1="04" i2="3"><s0>001B60H55J</s0></fC02><fC02 i1="05" i2="X"><s0>230</s0></fC02><fC03 i1="01" i2="X" l="FRE"><s0>Cellule solaire</s0><s5>01</s5></fC03><fC03 i1="01" i2="X" l="ENG"><s0>Solar cell</s0><s5>01</s5></fC03><fC03 i1="01" i2="X" l="SPA"><s0>Célula solar</s0><s5>01</s5></fC03><fC03 i1="02" i2="X" l="FRE"><s0>Dépôt électrolytique</s0><s5>02</s5></fC03><fC03 i1="02" i2="X" l="ENG"><s0>Electrodeposition</s0><s5>02</s5></fC03><fC03 i1="02" i2="X" l="SPA"><s0>Depósito electrolítico</s0><s5>02</s5></fC03><fC03 i1="03" i2="X" l="FRE"><s0>Indium</s0><s2>NC</s2><s5>03</s5></fC03><fC03 i1="03" i2="X" 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aluminium</s0><s4>INC</s4><s5>48</s5></fC03><fC03 i1="25" i2="X" l="FRE"><s0>SnO2</s0><s4>INC</s4><s5>49</s5></fC03><fC03 i1="26" i2="X" l="FRE"><s0>Substrat verre</s0><s4>INC</s4><s5>50</s5></fC03><fC03 i1="27" i2="X" l="FRE"><s0>8460J</s0><s4>INC</s4><s5>71</s5></fC03><fC03 i1="28" i2="X" l="FRE"><s0>8115P</s0><s4>INC</s4><s5>72</s5></fC03><fC03 i1="29" i2="X" l="FRE"><s0>6855N</s0><s4>INC</s4><s5>73</s5></fC03><fC03 i1="30" i2="X" l="FRE"><s0>6855J</s0><s4>INC</s4><s5>74</s5></fC03><fN21><s1>136</s1></fN21><fN44 i1="01"><s1>OTO</s1></fN44><fN82><s1>OTO</s1></fN82></pA></standard></inist></record>Pour manipuler ce document sous Unix (Dilib)
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